Research

JP

High thermal stability and low thermal resistance of large area GaN/3C-SiC/diamond junctions for practical device processes

2023/12/01

Publication Details

Authors

Ryou Kagawa, Zhe Cheng, Keisuke Kawamura, Yutaka Ohno, Chihara Moriyama, Yoshiki Sakaida, Sumito Ouchi, Hiroki Uratani, Koji Inoue, Yasuyoshi Nagai, Naoteru Shigekawa and Jiambo Liang

Journal

Small

DOI

https://doi.org/10.1002/smll.202305574

Online publication date

November 15, 2023

Press release online (in Japanese)

PDF:  938 KB

From: High thermal stability and low thermal resistance of large area GaN/3C-SiC/diamond junctions for practical device processes

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