A goal of our research is to develop new industrial methods in quantitative elemental analysis. The direct determination of trace elements in industrial materials gives important information that contributes to the progress of recent material science. We suggest new analytical methods enabling trace elements at a few ppm level to be directly determined in atomic emission spectrometry. We also study analytical applications of a low-pressure laser induced plasma as well as a glow discharge plasma associated with a spacially-resolved measurement by using an imaging spectrometer system. Fundamental research on the excitation mechanism of several excitation sources in atomic emission spectroscopy such as a radio-frequency inductively-coupled plasma and a microwave induced plasma is conducted. Further, we investigate elemental analysis utilizing Cathodeluminescence phenomenon, surface analysis techniques such as X-ray photoelectron spectroscopy, and nano-scale X-ray analysis such as smallangle X-ray scattering and extended X-ray absorption fine structure. We also develop portable analyzers and a novel method of atomic absorption spectrometry using a high sensitive spectrometer.
Materials Processing and Characterization Division
- Assoc. Prof. Susumu IMASHUKU
- Assist. Prof. Hideyuki MATSUTA
- Assist. Prof. Shunsuke KASHIWAKURA
Developing Novel Methods for Elemental Analysis
elemental analysis, solid-sample emission, on-site/on-line analysis