A goal of our research is to develop new industrial methods in quantitative elemental analysis. The direct determination of trace elements in high-purity materials gives important information that contributes to the progress of recent material science. We suggest new analytical methods enabling trace elements at a few ppm level to be directly determined in atomic emission spectrometry. We also study analytical applications of a low-pressure laser induced plasma as well as a glow discharge plasma associated with a spacially-resolved measurement by using an imaging spectrometer system. Fundamental research on the excitation mechanism of several excitation sources in atomic emission spectroscopy such as a radio-frequency inductively-coupled plasma and a microwave induced plasma is conducted. Further, we investigate elemental analysis utilizing Cathodeluminescence phenomenon, surface analysis techniques such as X-ray photoelectron spectroscopy, and nano-scale X-ray analysis such as small-angle X-ray scattering and extended X-ray absorption fine structure. We also develop portable analyzers and a novel method of atomic absorption spectrometry using a high sensitive spectrometer.
Materials Processing and Characterization Division
|Assist. Prof.||Hideyuki MATSUTA|
|Assist. Prof.||Shunsuke KASHIWAKURA|
Developing novel methods for elemental analysis
elemental analysis, solid-state emission, on-site/on-line analy