Materials Processing and Characterization Division

Analytical Science Research Laboratory

Tetsu ICHITSUBO

Prof.Tetsu ICHITSUBO

  • Prof. Masashi WATANABE
  • Assoc. Prof. Susumu IMASHUKU

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Development and Applications of Nano Fine-structure Characterization and Chemical Analysis for Understanding Various Materials Properties

Various materials properties used in many industrial fields can be caused by fine fluctuations of structural arrangements, compositions, and chemical bonding states in atomic scale. It is important to measure such local fluctuations in materials accurately and precisely, which requires both atomic-level spatial resolution and single-atom sensitivity in characterization. In this research division, we conduct materials fine-structure characterization by transmission electron microscopy (TEM) and scanning electron microscopy (SEM) in combination with and chemical composition/sate analysis through X-ray energy dispersive spectrometry (XEDS) and electron energy-loss spectrometry (EELS). In addition, we also develop analytical techniques by laser induced breakdown spectroscopy for distribution measurement of light elements such as hydrogen, lithium, oxygen, and nitrogen, by cathodoluminescence spectroscopy for identification and distribution measurements of compounds, and by optical emission spectroscopy for in-situ determination of film compositions during sputtering.

electron microscopy, spectrometry, materials characterization
Direct observation of bismuth atom segregation on a Copper grain boundary by high-angle annular dark-field STEM imaging

Direct observation of bismuth atom segregation on a Copper grain boundary by high-angle annular dark-field STEM imaging

Atomic-resolution elemental maps of strontium titanite by high-resolution STEM-XEDS

Atomic-resolution elemental maps of strontium titanite by high-resolution STEM-XEDS

Laser-Induced Plasma (left) and obtaind emission spectra (right)

Laser-Induced Plasma (left) and observed emission spectra (right)

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